Showing results: 16 - 30 of 360 items found.
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imc Test & Measurement GmbH
Electric drives such as DC and EC motors are more and more extensively deployed in the automotive industry. At the same time there is an increasing requirement for a 100% analysis of motors for fault detection and error analysis as well as statistics on quality, without increasing production cycles times. The model-based Parameter Identification method (PI method) from imc allows testing to be performed under load, yet without an “explicit” separate load machine. Instead, the motor is loaded dynamically by exploiting its own inherent inertia. This allows motor parameters such as resistance, inductivity and friction to be determined within a few seconds. A mathematical model and its parameters reflect motor behaviour in its completeness and make it possible to monitor motor production based on limit values and trend statistics. The identified parameters of the model equation can then be used to calculate derived key performance indicators of the motor characteristic curve.
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Vogelsang & Benning
Test bench for electric machines and inverters in hybrid applications*Control of mechanical parameters*Verification of electrical properties*Checking the LL characteristics*Short circuit measurement*Recording the performance process*Noise measurement*Temperature measurement
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MOTOMEA
High Speed EV Motor - Unique Testing capabilities (MEA patented Inertial Dynamometer)Complete load testing of high speed EV motors (for example: 75kW, 32000 rpm)Load testing without connecting the EV motor to any mechanical loadRipple Torque, Friction Torque, Friction Spectrum, Speed & Torque Spectrum, Back EMF
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68PW1 -
North Atlantic Industries
The 68PW1 is a 3U OpenVPX SOSA™-aligned (basis, Snapshot 2) single-axis PWM servo motor drive that can be configured with closed loop feedback measurement options including Hall, Resolver/Synchro or Encoder. The PWM drive provides programmable PWM output drive (up to 65 V @ 10 A continuous) from a single +28 VDC input source. Ideally suited for rugged Mil-Aero applications, the 68PW1 delivers off-the-shelf solutions that accelerate deployment of SWaP-optimized systems in air, land and sea applications.
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64PW2 -
North Atlantic Industries
NAI’s 64PW2 is a 6U VME Servo Motor Driver/Amplifier Board featuring a dual, four-quadrant, bi-directional, PWM servo amplifier. Specifically targeted for DC servo motor applications, this board has an amplified power stage that uses a Pulse Width Modulation (PWM) control signal to provide motor control for both brush and brushless motors. Each motor drive accepts a 65 VDC power input and provides a 5 Amp maximum continuous current output (8.5 Amp peak).
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PXP-500A -
Teledyne LeCroy
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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Teledyne LeCroy
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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iWave Systems Technologies
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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27014 -
Chroma ATE Inc.
Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
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TS-960e -
Marvin Test Solutions, Inc.
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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17020E -
Chroma ATE Inc.
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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3380P -
Chroma ATE Inc.
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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17040E -
Chroma ATE Inc.
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
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3380D -
Chroma ATE Inc.
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.